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Published Papers

Citation

William P. Kuhn

“Assessing the W2-AM for use in profiling x-ray optics”, Proc. SPIE 10747, Optical System Alignment, Tolerancing, and Verification XII, 107470C (19 September 2018); doi: 10.1117/12.2323280;

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

DOI abstract  https://doi.org/10.1117/12.2323280

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Citation

William P. Kuhn

“Measurement of low-order aberrations with an autostigmatic microscope”, Proc. SPIE 10377, Optical System Alignment, Tolerancing, and Verification XI, 103770C (22 August 2017); doi: 10.1117/12.2274813

© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).

Downloading of the abstract is permitted for personal use only.
Systematic reproduction and distribution, duplication of any material in this
paper for a fee or for commercial purposes, or modification of the content of
the paper are prohibited.
DOI abstract  http://dx.doi.org/10.1117/12.2274813 

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The W2-AM alignment module is described in this paper and its performance compared to the PSM designed by Bill Kuhn a number of years ago.

Citation

William P. Kuhn
” Design and performance of a new compact adaptable autostigmatic alignment tool “, Proc. SPIE 9951, Optical System Alignment, Tolerancing, and Verification X, 995109 (September 27, 2016); doi:10.1117/12.2239213; 
Copyright 2016 Society of Photo Optical Instrumentation Engineers.
One print or electronic copy may be made for personal use only.
Systematic reproduction and distribution, duplication of any material in this
paper for a fee or for commercial purposes, or modification of the content of
the paper are prohibited.
DOI abstract  http://dx.doi.org/10.1117/12.2239213
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The use of the PSM, an autostigmatic microscope and predecessor to the W2-AM is described in this paper.

Citation

Robert E. Parks; William P. Kuhn

“Optical alignment using the Point Source Microscope”, Proc. SPIE 5877, Optomechanics 2005, 58770B (September 09, 2005); doi:10.1117/12.618165;
Copyright 2005 Society of Photo Optical Instrumentation Engineers.
One print or electronic copy may be made for personal use only.
Systematic reproduction and distribution, duplication of any material in this
paper for a fee or for commercial purposes, or modification of the content of
the paper are prohibited.
DOI abstract  http://dx.doi.org/10.1117/12.618165
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